MEASUREMENT OF MINORITY-ARRIER LIFETIME IN SILICON SOLAR CELLS BY THE PHOTOCONDUCTIVE DECAY METHOD. Nigerian Journal of Technology, [S. l.], v. 6, n. 1, p. 51–55, 2002. DOI: 10.4314/njt.61.364. Disponível em: https://nijotech.com/index.php/nijotech/article/view/364. Acesso em: 16 apr. 2026.